Optical spectroscopy
Ellipsometer UV/VIS/NIR J.A. Woollam RC2
The J.A. Woollam RC2 is a spectroscopic ellipsometer that combines dual rotating compensators with a wide spectral range to measure film thickness, optical constants (n & k) and anisotropy with very high precision.
Configuration
Dual Rotating Compensator
Wavelength range
210nm to 1000nm (790 wavelengths) completed by NIR extension 1005nm to 2500nm (250 wavelengths)
Spectral resolution
1nm wavelength spacing, < 2. 5nm FWHM for 210 nm – 1000 nm range and 6 nm wavelength spacing, < 15 nm FWHM for 1005 nm – 2500 nm range
Ellipsometer IR J.A. Woollam IR-VASE
The J.A. Woollam IR-VASE is a spectroscopic ellipsometer optimized for the infrared range, used to characterize optical constants, phonon modes, free-carrier absorption, and film thickness in semiconductors, polymers, and other IR-active materials.
Configuration
Step-scan rotating compensator
Maximum sample size
200mm diameter, 25mm diameter.
Spectral range
1.7μm to 30μm (333 cm-1 to 5900 cm-1)
Spectral resolution
1, 2, 4, 8, 16, 32, or 64 cm-1
Fourier Transform Infrared Spectrometer Bruker VERTEX 80v + verTera on Hyperion II microscope
The Bruker Hyperion II is a FTIR microscope that enables infrared spectroscopic imaging and microspectroscopy with high spatial resolution, useful for chemical mapping, defect analysis, and material characterization. The verTera extension allows to reach THz spectral range.
Spectral range
from 3 cm-1 to 20,000 cm-1
Spectral resolution
0.2 cm-1 except for the THz region
Detectors
Si diode detector, TE-cooled InGaAs detector, LN-cooled MCT detector, DLaTGS detector
Temperature control stage
from -196ºC to 300ºC
Raman microscope Renishaw inVia
The Renishaw inVia is a confocal Raman microscope used for chemical, structural, and stress analysis with micron spatial resolution.
Spectral resolution
0.5 cm-1 (FWHM)
Raman spectral range
100 cm-1 to 4000 cm-1
Spectrometer range
200 nm – 2000 nm
Lasers available
wavelengths of 532 nm, 633 nm, 785 nm
Microscope objectives
5x, 20x, 50x, 100x, 63x immersion
Micro-spectrophotometer Technospex uSight-2100
The Technospex uSight-2100 is micro-spectroscopy system that measures transmittance, absorption, reflectance of samples at micron sampling area
Wavelength range and resolution
200 nm – 1100 nm (Linear Array Detector), 900 nm – 1700 nm (uncooled InGaAs)
Spectral resolution
2nm at 200 nm -1100 nm range, 6 nm at 900 nm – 1700 nm range
Spot size
down to ~1um (100x objective lens)
Stage
75mm x 50mm motorized with 0.1 um step size
Microscope objectives
20x, 50x, 100x